en
fr
en
Recruitment
Contact
Sign in
Menu
Home
Characterization offer
Characterization of Material Properties
Dielectric materials
Magnetic materials
Complex Materials
Materials Under Specific Environmental Conditions
Characterization of Active and Passive Components and Circuits
S-Parameter Measurement
Large-Signal Measurements
Noise Measurement
Time Domain Measurements
Specific Measurements of Voltage/Current Controlled Components
Characterization of Digital/Logical Signals
Antenna and Radiation Characterization
Radiation Patterns
Field Mapping
Electromagnetic Imaging/Diagnostics
S-Parameter Measurement
Specific Measurements
Characterization of Functional Systems
Electromagnetic Compatibility (EMC) Measurements
Telecom Measurements
Energy Efficiency Characterization
Propagation Channel Characterization
LOS SISO Propagation Channel Measurements
NLOS SISO Propagation Channel Measurements
MIMO Propagation Channel and Localization Measurements
Our platforms
Partner laboratories
News and events
NANOCOM
Contact and access
Contact details
351 Cours de la Libération, 33405 Talence Cedex, France
Contact us
I am not a robot
By submitting this form, I accept that the information entered will be processed by INSIS as part of my request.
Send
Description
Contacts and access
