MULTI-PHYSICS CHARACTERIZATION PLATFORM
The PCMP is one of the two platforms at IEMN accredited by the University of Lille. It is composed of four divisions dedicated to the characterization of materials, devices, and electronic systems, from the nanometric scale to full electronic systems in their operational environment. It also includes activities related to instrumentation development and prototyping. Three of its divisions are members of the RF-Net network:
CHOP (Microwave, Optical and Photonic Characterization):
The CHOP division, ISO8 certified, occupies 900 m² and brings together IEMN’s shared facilities for characterizing the main electrical parameters of electronic components and subsystems. It enables vector or scalar electrical characterization from DC up to THz frequencies, under temperature control (cryogenic, ambient, up to 500 K), with laser or solar illumination, on-wafer (coplanar probes), coaxial or free-space measurements, and under static, small-signal or large-signal conditions.
SigmaCom (Communicating Systems Characterization and Prototyping):
SigmaCom offers a wide range of advanced scientific equipment for the design and testing of new communication systems using radio modules (up to the millimeter-wave range) and sensors. This division provides software and hardware tools to design, program, and test both the analog and digital parts of smart and connected devices, up to 110 GHz.
C2EM (Characterization, Electromagnetic Compatibility, and Prototyping):
The C2EM division covers 180 m² and is equipped with three major facilities that simulate specific electromagnetic environments: an anechoic chamber, a reverberation chamber with mode stirring (CRBM), and a TEM cell. It has also developed the MIMOSA real-time channel sounder (Multiple Input Multiple Output System Acquisition) supporting real-time MIMO (16Tx, 16Rx) and Massive MIMO (64Tx, 16Rx). Its main applications include real-time characterization of propagation channels inside buildings and in mobility contexts (vehicles, aircraft, boats, etc.)
